Remark: Please read the attached release notes carefully. Please also make sure to keep your SurfaceLab help updated.
24.05.2024
IONTOF Launches The Americas User School 2025 - Virtual Training for TOF-SIMS Users
IONTOF is excited to announce The Americas User School 2025, a virtual training event designed for our TOF-SIMS users across The Americas and beyond. Following the success of our June 2025 IONTOF User School, this online program offers a unique opportunity for interactive learning and expert exchange - right from your lab or office.
Event Highlights
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Dates: November 17th, 19th, and 20th, 2025
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Format: Three-hour online sessions (9 am - 12 pm EST), each focusing on key aspects of TOF-SIMS instrumentation and data analysis using SurfaceLab 7.6.
Why Attend?
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Hands-on Learning: Live demonstrations by IONTOF application scientists.
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Expert Interaction: Direct Q&A and discussions tailored to your research needs.
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Flexibility: No travel required-participate from anywhere in the world.
Registration Details
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Deadline: November 7th, 2025
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Availability: 150 spots per course (first-come, first-served)
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Prerequisites: Basic SIMS knowledge and prior instrument experience recommended.
Join Us! Enhance your TOF-SIMS expertise and connect with our experts. Register now to secure your spot.
We were delighted to welcome so many customers to the IONTOF User Event 2025 at the University of Giessen, following SIMS Europe 2025. It was a pleasure to connect with our community - customers, collaborators, and colleagues - and to share insights into the latest developments in surface analysis.
The event provided a valuable platform for discussions on our TOF-SIMS technology, instrument operation and application. Our customers had the chance of attending M6 Plus and M6 Hybrid SIMS demonstrations as well as meet the expert sessions with many IONTOF colleagues on site.
We're grateful for the engaging conversations and the opportunity to learn from all of you.
Thank you for making this gathering both productive and enjoyable. We look forward to continuing our collaboration and exploring new possibilities together.
A special thank you to our IONTOF team for their hard work in organising and supporting the event.
IONTOF User Event 2025 at the University of Giessen, following SIMS Europe 2025
02.06.2025
IONTOF User Event and User Meeting 2025
Join us for the IONTOF User Event and User Meeting 2025, set in a charming location that promises a captivating mix of scientific discovery, networking opportunities, and culinary delights.
Mark your calendars for September 9th, 2025 evening, and join us in a secret location for an unforgettable experience. The next day, on September 10th, we will continue with the IONTOF User Meeting at the SIMS Europe venue, offering further insights, latest news from IONTOF as well as the opportunity to discuss with our experts.
We can't wait to welcome you!
Can you guess where we'll meet?
In a town where optics and precision meet,
Near waters calm, a dining retreat.
Not far from where the SIMS minds convene,
A hidden gem, serene and green.
By a lake where reflections play,
A restaurant awaits to light your way.
With a name that anchors you in place,
Find us there, with a smile on your face.
Don't forget, securing your place at this unmissable event requires registration. Click the link below to sign up.
Remark: Please read the release notes carefully. Please also make sure to keep your SurfaceLab help updated.
02.04.2025
Virtual IONTOF User School 2025
We are excited to announce that IONTOF will host another virtual User School in July 2025 for our TOF-SIMS instrument users.
Continuing our successful online format, the Virtual User School 2025 will allow participants from around the globe to attend conveniently and free of charge.
The event is designed to facilitate an interactive exchange between participants and application scientists using Microsoft Teams.
Due to the virtual setting, we have planned several courses on different days. Each course will last approximately three hours, covering comprehensive content while leaving time for individual questions and discussions.
The courses are tailored for TOF-SIMS users and will include all contents of the traditional face-to-face User School, as well as the latest new features. This includes typical workflows in an analytical SIMS lab, from sample holder preparation to selecting appropriate measurement conditions, and focusing on data evaluation and interpretation using a comprehensive range of tools present in the latest SurfaceLab 7.5 software. For the first time, we will also offer a dedicated session for the M6 Hybrid SIMS.
All courses are suitable for beginners in instrument usage and data analysis. We will also include the latest features of our software, ensuring that experienced users benefit from attending as well.
If you would like to attend the IONTOF User School courses in 2025, please use the registration form.
Registration will be free for all our existing customers.
SurfaceLab 7.5 Release - Streamlined Instrument Operation and Enhanced User Experience
We are pleased to announce the release of SurfaceLab 7.5, the latest iteration of our advanced software suite. This update reflects IONTOF's commitment to continuously improving the user experience and operational efficiency of our instruments.
At IONTOF, we focus on creating software that helps users get the most out of their instruments.
SurfaceLab 7.5 continues this effort with improvements that make our instruments easier to use and more effective in producing high-quality data.
For a detailed overview of all the new features, download our "New Features of SurfaceLab 7.5" presentation from the download area. The software installer is also available for download.
SurfaceLab 7.5 introduces features designed to make instrument operation more intuitive and user-friendly. Automation enhancements and improved navigation tools ensure that users can focus more on analysis and less on setup.
Improved Sample Navigation
With new navigation features and automated checks, users can handle samples with greater precision and confidence. These updates streamline workflows and reduce the potential for errors.
Advanced Automation
New automation recipes and routines simplify complex tasks, maintaining a smooth workflow for more efficient data collection and analysis.
Optimized Instrument Operation
Updates to measurement dialogues, energy selection, and surface potential routines provide users with more control and faster results, particularly beneficial for M6 instrument users.
Enhanced Visualization
The new 3D rendering dialogue and lateral shift correction options offer improved visualization capabilities, enabling users to gain deeper insights from their data.
18.12.2024
Season's Greetings 2024
IONTOF Season's Greetings 2024
As we approach the end of the year, we want to extend our heartfelt thanks for your trust and enjoyable cooperation.
The IONTOF team wishes you, your families, and loved ones a peaceful, healthy, and prosperous New Year.
We look forward to continuing our successful collaboration in 2025.
Warm regards,
The IONTOF Team
08.11.2024
Dr. Alexander Pirkl honored with Peter Sherwood Mid-Career Award
We are thrilled to announce that Dr. Alexander Pirkl, Product Manager M6 Hybrid SIMS at IONTOF has been honored with the prestigious Peter Sherwood Mid-Career Award!
This award recognizes his outstanding contributions to advancing the fundamentals and applications of Orbitrap SIMS.
Alexander’s dedication and innovative work have significantly impacted our field, and we couldn’t be prouder of his achievements.
This recognition is a testament to his hard work, passion, and commitment to excellence.
Please join us in congratulating Alexander on this well-deserved honor!
Dr. Alexander Pirkl honored with Peter Sherwood Mid-Career Award for contributions to advancing Orbitrap SIMS
10.07.2024
IONTOF User Event 2024
Excited to announce the IONTOF User Event 2024, set against the backdrop of the picturesque La Rochelle during the SIMS-24 conference. This exclusive event promises to be a delightful blend of science, networking, and gastronomy.
The User Event will take place on September 10th 2024.
Let's raise a glass to the fusion of cutting-edge technology and timeless camaraderie. See you there!
Remember, registration is mandatory to ensure a spot at this not-to-be-missed gathering. Please use the link below.
Morgan Alexander's (Nottingham University) has been awarded with the Rivière Prize. This is a testament to his significant contributions to the field of surface analysis. This prestigious award, bestowed by the UK Surface Analysis Forum, honors individuals whose work has profoundly influenced researchers within the domain.
Alexander's impact stems not only from his innovative use of the OrbiSIMS instrument, produced by IONTOF and commercialised as the M6 Hybrid SIMS, but also from his role as a mentor within the scientific community. His dedication to advancing surface analysis techniques and nurturing the next generation of scientists aligns with the legacy of the prize's namesake, John Rivière, who was instrumental in establishing the UK's focal point in applied surface science. Alexander's recognition serves as an inspiration, reflecting the importance of mentorship and innovation in driving scientific progress.
Rivière Prize awarded to Morgan Alexander
24.05.2024
Virtual The Americas IONTOF User School 2024
We are happy to announce that IONTOF will hold a virtual User School from July 9th until July 11th 2024 for our TOF-SIMS users in the Americas time zones.
Our applications specialists have designed an online program that will allow an interactive exchange between themselves and participants using our video conferencing tool. Each session is designed to last approximately three hours which should be enough time to cover the respective content, as well as leave time for individual questions and discussion.
The courses are dedicated to TOF-SIMS users and will cover all contents of the traditional face-to-face User School but also latest new features. This includes typical workflows in an analytical SIMS lab, ranging from sample holder preparation to the selection of appropriate measurement conditions and finally focusing on data evaluation and interpretation, using a comprehensive range of tools present in the latest SurfaceLab 7.4 software.
If you would like to attend the Americas IONTOF User School courses 2024 please use the registration form below. Please note that places will be allocated on a "first come first served" basis.
We are happy to announce that IONTOF will hold another virtual User School in May 2024 for our TOF-SIMS instrument users.
We will continue our very successful online format to host the User School in 2024, allowing our users to attend from all over the world conveniently.
The event is designed to assure an interactive exchange between participants and application scientists using our video conferencing tool. Due to the virtual setting of the IONTOF User School we have decided to offer several courses on different days. Each course is designed to last approximately three hours to cover the respective content, as well as leaving time for individual questions and exchange.
The courses are dedicated to TOF-SIMS users and will cover all contents of the traditional face-to-face User School but also latest new features. This includes typical workflows in an analytical SIMS lab, ranging from sample holder preparation to the selection of appropriate measurement conditions and finally focusing on data evaluation and interpretation, using a comprehensive range of tools present in the latest SurfaceLab 7.4 software.
All courses are dedicated to beginners in instrument usage as well as data analysis.
We will however strive to also include latest features of our software, so that our experienced users will benefit from attending as well.
If you would like to attend the IONTOF User School courses 2024 please use the registration form.
The registration will be free for all our existing customers.
Please note that in July 2024 we are planning a dedicated edition for The Americas as well.
Places will be allocated on a "first come first served" basis.
IONTOF is proud to announce that Prof. Dr. Ian Gilmore has been honoured with the prestigious Alfred Benninghoven Award. It is presented to individuals who have made significant contributions to the field of Secondary Ion Mass Spectrometry (SIMS) and related techniques.
Prof. Gilmore, from the National Physical Laboratory (UK), has been recognized for his groundbreaking ideas leading to the development of a novel instrument that marries the benefits of ToF-SIMS with the high-mass resolution and structural analysis capabilities of the Orbitrap mass spectrometer. This innovation represents a major leap forward in the analytical power of SIMS, providing unprecedented insights into material composition and structure.
Prof. Gilmore's achievement not only reflects his personal dedication and expertise but also underscores the collaborative spirit and innovative drive that are hallmarks of the SIMS community. His work will undoubtedly inspire future advancements and applications, furthering our understanding of material surfaces and interfaces.
As the recipient of the Alfred Benninghoven Award, Prof. Gilmore will deliver a plenary lecture at the upcoming SIMS 24 conference, where he will share his insights and experiences with fellow researchers and practitioners. He will also receive a commemorative plaque or medal and a cash prize of 5000 euros, celebrating his outstanding contribution to the field.
The award, named after Prof. Dr. Alfred Benninghoven, himself a pioneer in the development of SIMS, serves as a testament to the enduring impact of innovative research and the continuous pursuit of excellence. IONTOF extends its warmest congratulations to Prof. Gilmore and his whole team and looks forward to their continued contributions to the scientific community.
On 13.03.2024, the BeNeFrance IONTOF user community convened at IMEC in Leuven, Belgium, marking an important day for our user community. The insights shared by IONTOF instrument users were nothing short of inspiring, showcasing the vast potential and diverse applications of TOF-SIMS technology.
A heartfelt thank you to Alexis Franquet and Anouk Galtayries for their impeccable organization of this event, with support from the SFV. Their efforts made it possible to host this gathering at such a technologically pivotal location. The anticipation for future francophone user meetings is high, and we are eager to witness the continued growth of the community and innovation from their research.
29.02.2024
SurfaceLab 7.4 Release - Introducing HDR mode for M6 instruments
The most recent version of our SurfaceLab software, SurfaceLab 7.4, has been released. This update brings a plethora of new features and enhancements for operating our instruments and analysing data. Whether you are a beginner or an experienced user, SurfaceLab 7.4 aims to streamline your workflow and provide valuable insights.
A major improvement was made in how to acquire images or profiles with an M6 instruments introducing a High Dynamic Range (HDR) mode to acquire a low current and high current data set of the same Field of View in one automated run. This approach, inspired from HDR photography, helps to generate datasets without saturated profile lines or pixels in
images at maintained high sensitivity.
The new release further provides new 3D correction features that not only apply the 3D representations, but actually correct the underlying data, allowing to extract corrected depth profiles.
Further features are an automated wedge preparation routine, or the possibility to align external images (from a microscope for example) with the sample holder image in the Sample Holder Info Editor for even easier and more precise sample navigation.
YouTube videos highlighting several features will become available in the coming months.
Several helpful videos on SurfaceLab 7 features and our IONTOF techniques are
already available and will certainly help you with our software tools and to gain more knowledge of our technology.
Subscribe to our YouTube channel to stay tuned…
All main features are described in our New Features of SurfaceLab 7.4 presentation available in your download area. Of course you may also download the installer from here.
IONTOF Partners with Leading European Energy Storage Initiative
IONTOF is thrilled to announce our partnership with a prominent European energy storage research consortium. This collaboration, showcased on Storeage.eu, is a major step forward in our mission to advance sustainable energy solutions.
The European energy storage initiative, led by top researchers and industry experts, addresses the pressing need for cutting-edge energy storage solutions. This demand is driven by the transition to renewable energy sources and the rise of electric vehicles.
IONTOF's involvement underscores our commitment to innovation in clean energy technologies. Our advanced surface analysis instrumentation will provide critical insights into the materials used in energy storage devices. More information can be found on
After 11 successful conferences in Muenster, Germany, SIMS Europe moved to the University of Nottingham, UK, for its latest workshop. Initially launched in 1998, this compact and cost-effective scientific meeting, designed to engage young researchers and students, underwent a few changes, with David Scurr from the University of Nottingham stepping in as the 2023 host after pandemic-related disruptions.
Dr. Anja Henss Justus Liebig University Giessen Institute of Physical Chemistry
Looking ahead, the next conference is scheduled for September 7-9, 2025, at the University of Giessen, Germany, led by Anja Henss, Marcus Rohnke, and Michael Dürr. Plans are also underway to establish a scientific steering committee for SIMS Europe, enabling various European SIMS groups to host future meetings, overseen by Arnaud Delcorte.
PD Dr. Marcus Rohnke Justus Liebig University Giessen Institute of Physical Chemistry
Stay updated on these exciting developments on the SIMS Europe website, and share your suggestions and ideas directly with Arnaud. The SIMS Europe Team is thrilled to continue this successful conference series and can't wait to welcome you to Giessen in 2025.
Prof. Dr. Michael Dürr Justus Liebig University Giessen Institute of Applied Physics
06.04.2023
SurfaceLab 7.2 Update
SurfaceLab 7 Version 7.2.135568 Bugfixing Release 6 has just been released and is available for download from our download area:
Remark: Please read the attached release notes carefully. Please also make sure to keep your SurfaceLab help updated.
02.03.2023
Virtual IONTOF User School 2023
We are happy to announce that IONTOF will hold another virtual User School in April 2023 for our TOF-SIMS instrument users.
We will continue our very successful online format to host the User School in 2023, allowing our users to attend from all over the world conveniently.
The event is designed to assure an interactive exchange between participants and application scientists using our video conferencing tool. Due to the virtual setting of the IONTOF User School we have decided to offer several courses on different days. Each course is designed to last approximately three hours to cover the respective content, as well as leaving time for individual questions and exchange.
The courses are dedicated to TOF-SIMS users and will cover all contents of the traditional face-to-face User School but also latest new features. This includes typical workflows in an analytical SIMS lab, ranging from sample holder preparation to the selection of appropriate measurement conditions and finally focusing on data evaluation and interpretation, using a comprehensive range of tools present in the latest SurfaceLab 7.3 software.
All courses are dedicated to beginners in instrument usage as well as data analysis.
We will however strive to also include latest features of our software, so that our experienced users will benefit from attending as well.
If you would like to attend the IONTOF User School courses 2023 please use the registration form.
The registration will be free for all our existing customers.
Places will be allocated on a "first come first served" basis.
SurfaceLab 7.3 Release - New setting file concept for more intuitive instrument operation
With SurfaceLab 7.3 we just released the latest version of our extraordinary instrument operation and data analysis software.
The new release comes with a multitude of new features and improvements for operation of all our instruments as well as data evaluation.
A major improvement was made in how to start and operate our M6 instruments introducing a new common setting file concept, allowing to operate all analytical components by selecting default setting files from simple drop-down menus in the respective FPanel container or from the power on dialogue.
The new release also provides a fully remastered spectra printing dialogue, allowing a more convenient an efficient way to export your spectra to presentations or reports.
Further features are a new z-ROI and Lateral ROI setting menu, segmented y-scaling in spectra program, a new filter function for the Peak Evaluation Checkbox, support for a click of a button NIST library search and many, many more.
YouTube videos highlighting several features will become available in the coming months.
Several helpful videos on SurfaceLab 7 features and our IONTOF techniques are already available and will certainly help you with our software tools and to gain more knowledge of our technology.
All main features are described in our New Features of SurfaceLab 7.3 presentation available in your download area. All features and bugfixes are described in our Release Notes.
On 22.06.2022 the French speaking IONTOF user community gathered in the historic amphitheatre Gintrac at the University of Bordeaux. The science presented by our IONTOF instrument users was very inspiring and absolutely fascinating. A great demonstration of the huge variety in application for the TOF-SIMS technology.
IONTOF would like to express our gratitude to the organizers Anouk Galtayries, Alain Brunelle and Nicolas Desbenoit for organising this meeting in such an historic place. We are very much looking forward to future francophone user meetings.
Historic amphitheatre Gintrac at the University of Bordeaux
20.04.2022
IUVSTA awards International Prize for Technology to Ian Gilmore, NPL Senior fellow
We are happy to announce that Professor Ian Gilmore, Senior Fellow at NPL London and visiting Professor at the University of Nottingham, has been awarded the IUVSTA Prize for Technology for pioneering advances in vacuum instrumentation. Our collaboration with Ian Gilmore resulted in the development of our M6 Hybrid SIMS instrument, combining an M6 TOF-SIMS instrument with an Orbitrap mass analyser, enabling innovative multidisciplinary research. The prize is the highest prize given by the IUVSTA every three years.
The International Union for Vacuum Science, Technique and Application (IUVSTA) represents nearly 15,000 scientists and engineers who are active in basic and applied vacuum research. IONTOF congratulates Ian Gilmore and his team for this outstanding and well deserved achievement.
IONTOF is very proud to inform that the Virtual IONTOF User School 2022 was a great success. With more than 220 participants from all continents joining our sessions we were able to introduce many of our users to the operation of our instruments, the conceptual design of experiments as well as the use of our powerful new SurfaceLab 7.3 software features, recently pre-released.
We thank all participants for their active participation and valued feedback throughout the sessions and will certainly continue this virtual seminar series in the future. Nevertheless, as soon as the pandemic situation allows safe face to face meetings again, we will also organize a European User School at our headquarters in Germany again.
01.03.2022
Virtual The Americas IONTOF User School 2022
We are happy to announce that IONTOF will hold a virtual User School on April 26th and 27th 2022 for our TOF-SIMS users in the Americas time zones.
Our applications specialists have designed an online program that will allow an interactive exchange between themselves and participants using our video conferencing tool. Each session is designed to last approximately three hours which should be enough time to cover the respective content, as well as leave time for individual questions and discussion.
The courses are dedicated to TOF-SIMS users and will cover data evaluation and interpretation, using a comprehensive range of tools present in the latest SurfaceLab 7.3 software.
If you would like to attend the Americas IONTOF User School courses 2022 please use the registration form below. Please note that places will be allocated on a "first come first served" basis.
We are happy to announce that IONTOF will hold another virtual User School in March and April 2022 for our TOF-SIMS instrument users.
Due to the current pandemic restrictions, IONTOF has designed an online format to host the User School in 2022, allowing our users to attend the event safely. The event is designed to assure an interactive exchange between participants and application scientists using our video conferencing tool. Due to the virtual setting of this year's IONTOF User School we have decided to offer several courses on different days. Each course is designed to last approximately three hours to cover the respective content, as well as leaving time for individual questions and exchange.
The courses are dedicated to TOF-SIMS users and will cover all contents of the traditional face-to-face User School. This includes typical workflows in an analytical SIMS lab, ranging from sample holder preparation to the selection of appropriate measurement conditions and finally focusing on data evaluation and interpretation, using a comprehensive range of tools present in the latest SurfaceLab 7.3 software.
All courses are dedicated to beginners in instrument usage as well as data analysis. We will however strive to also include latest features of our software, so that our experienced users will benefit from attending as well.
If you would like to attend the IONTOF User School courses 2022 please use the registration form below.
We decided to implement a few changes compared to last year:
1
The registration will be free for all our existing customers
2
The limitations per course are now up to 150 instead of 40 attendees.
Places will be allocated on a "first come first served" basis.
IONTOF Announces Formation of New Subsidiary, IONTOF Japan K.K.
In 1996, IONTOF installed the first TOF SIMS instrument in Japan. From the very beginning, IONTOF could count on strong partners who supported our technical know-how with their many years of experience in sales and service. In Japan, IONTOF was first represented by CAMECA Japan and later by Hitachi High-Tech Science. During these successful times, more than 70 instruments were installed and IONTOF developed from a newcomer to an established market leader for TOF-SIMS instrumentation worldwide.
To further strengthen and improve support for our Japanese customers, IONTOF is very pleased to announce the formation of IONTOF Japan K.K..
The new company will take over all Hitachi High-Tech Science sales and service activities from April 1, 2022 onwards.
We are very grateful and proud that almost the entire Hitachi High-Tech Science sales and service team will join the new company to continue the successful work and further improve the service with the new support, commitment and flexibility that only a smaller company can provide.
IONTOF Japan will have its premises at German Industry Park in Yokohama, where offices, spare parts stock, and our demonstration facility will be available in one spot.
We hope that you will continue to support our work and soon benefit from the results of the new and even closer cooperation between IONTOF Japan and its German-based parent company. Further information about the new setup can be found on our new IONTOF Japan homepage at
SurfaceLab 7.2 Release - New powerful functionalities for instrument operation and data analysis
With SurfaceLab 7.2 IONTOF just released the latest version of its extremely powerful instrument operation and data analysis software. The new release comes with a multitude of new features and improvements for instrument setup and alignment as well as data evaluation.
The feature list includes many improvements such as fully automated sputter beam alignment, sputter current optimisation, one click sputter crater positioning and many others to improve the ease-of-use significantly.
Also the data analysis package has been updated, featuring new methods for automated analysis of depth profiles, multiple sectional concentration scales, powerful routines to find implant peak positions, as well as significantly improved performance for the calculation of possible peak assignments, just to name a few...
The new release also provides full operation and data analysis support for the TOF MS/MS option of the M6 in addition to new features for the Hybrid SIMS operation like an adaptive ion injection system (AIIS).
To demonstrate the different software features of SurfaceLab 7.2 we will share further YouTube videos in the coming months. Several helpful videos on SurfaceLab 7 features and our IONTOF techniques are already available and will certainly help you with our software tools and to gain more knowledge of our technology. Please subscribe to our YouTube channel to stay tuned…
Remark: Please read the release notes and our New Features of SurfaceLab 7.2 presentation carefully. Make sure to update your SurfaceLab help as well.
16.03.2021
Virtual IONTOF User School 2021
We are happy to announce that IONTOF will hold a User School in April and May 2021 for our TOF-SIMS instrument users. Due to the current pandemic restrictions, IONTOF has designed an online format to host the User School in 2021, allowing our users to attend the event safely.
The event is designed to assure an interactive exchange between participants and application scientists using our GoToMeeting video conferencing tool. Due to the virtual setting of this year's IONTOF User School we have decided to offer several courses on different days that may be booked individually.
The courses are dedicated to TOF-SIMS users and will cover all contents of the traditional IONTOF User School. This includes typical workflows in an analytical SIMS lab, ranging from sample preparation to the selection of appropriate measurement conditions and finally focusing on data evaluation and interpretation, using a comprehensive range of tools present in the latest SurfaceLab 7.2 software.
05.02.2021
New Honorary Fellows of the Royal Society of Chemistry announced
In 2020 the Royal Society of Chemistry's Board of Trustees announced Professor Emmanuel Iwuoha (University of the Western Cape, South Africa), Professor Pilar Goya Laza (Institute for Medicinal Chemistry, Madrid, Spain) and Professor Tebello Nyokong (Rhodes University, South Afrika) as new Honorary Fellows. Congratulations to all three for their outstanding academic achievements.
SurfaceLab 7 is the most recent instrument operation, data acquisition and data analysis software for all IONTOF instruments. With this versatile software IONTOF provides a professional solution for today's academic and industrial laboratories. Today, IONTOF has released the latest version of the extremely powerful SurfaceLab software. SurfaceLab 7.1 comes with a lot of improvements and new features. The release also includes IONTOF's new Multivariate Statistical Analysis (MVSA) package. The MVSA package is fully integrated and available for all SurfaceLab 7.1 users for free. We are sure that SurfaceLab 7.1 will again revolutionise the way TOF-SIMS data is handled.
To demonstrate the different software features we started to produce a series of YouTube videos, which we will release on a regular basis. The first videos are already online and we will add more content soon. So please feel free to subscribe to our YouTube channel to learn more about SurfaceLab and TOF-SIMS. Please go to…
Remark: Please also update your SurfaceLab help. Only the laterst help version (> 2022) is compatible with this bugfix release!
17.03.2020
IONTOF support during COVID-19 pandemic
As a reaction to the recent COVID-19 outbreak, IONTOF has put its pandemic contingency plan into effect. Currently the health and safety of our employees and their families have the uppermost priority. It is also our goal to maintain the highest possible level of customer service despite the present situation. As usual you will be able to reach the IONTOF support team by phone (+49 251 1622 200) or email (support@iontof.com). IONTOF also took precautions the ensure full spare part availability.
Official travel restrictions, however, limit our ability to provide on-site service. For the time being our engineers are not allowed to visit any customer sites. Please contact our hotline to check if we can find individual solutions in case you require on-site assistance.
We are sure that together we can get through this crisis and wish you and your families all the best for the coming weeks.
08.01.2020
Postdoctoral Position at the University in Gießen, Germany
The Justus-Liebig-University in Gießen offers a postdoctoral position in the research group of Prof. Jürgen Janek. Research will focus on the characterization of battery materials using ToF-SIMS, XPS and FIB-REM. The group of Prof. Janek is one of the leading groups in the field of battery research and offers a very attractive working environment. For more information, please contact:
After many years of constant commercial success, our current building finally reached its full capacity. To meet the demands of the next years IONTOF has now started to extend its current facility in Münster, Germany.
The new building extension will provide space for our entire service and service administration team and also provides additional storage space to support our extended product range. We hope that the new facility will be ready by the end of the second quarter 2020, a few months before the next SIMS Europe and our related user's meeting.
15.11.2019
Extremely Successful Launch of the all new M6 at SIMS 22 in Kyoto
The latest conference on secondary ion mass spectrometry (SIMS 22) was again a well organised and successful event. Thanks to Prof Jiro Matsuo and his team we all got a very positive impression of Japan and its unique culture.
Especially the conference dinner and the opportunity for selected participants to try on the traditional Japanese Kimono dress was very well received and we heard rumours that some candidates thought about changing their dress code even back home. For IONTOF the most important part of the conference was the launch of our all new M6.
Sven Kayser from the IONTOF sales team gave a comprehensive introduction of the new TOF-SIMS system during the first luncheon secession and we were all very pleased by the extremely positive response. It was very nice to finally see that all the hard work and the intensive design thoughts were appreciated by all our users.
13.05.2019
Learn more about Low Energy Ion Scattering (LEIS)
Thomas Grehl and Nathan Havercroft took the time to produce a series of short videos about low energy ion scattering. The series includes a general introduction into the technique but also covers other subjects such as quantification or thin film analysis. You can find the videos on our YouTube channel. Please go to…
The ECASIA conference series brings together scientists from universities, industry and instrument suppliers, to bridge the gap between fundamental and applied research in surface science. IONTOF is proud to sponsor the event and send Sven Kayser and Matthias Kleine-Boymann who will be present during the 2026 edition in Brussels.
Join us for the first-ever SIMS25 in China, a landmark event uniting academia and industry for a week of tutorials, cutting-edge discussions, and networking in the vibrant city of Guangzhou-your gateway to the future of surface analysis!
Experience the future of surface analysis at SIMS Europe 2027, set against the stunning backdrop of Catania-your gateway to innovation, inspiration, and connection with leaders in the field!
