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Customised Solutions TOF.SIMS 5 with Qtac Extension For many samples, including those with sensitive surfaces, the in-situ transfer between analytical techniques is very useful, avoiding contamination between analyses, and permitting direct comparison of results. The combination of the Qtac with the time-of-flight secondary ion mass spectrometer TOF.SIMS 5 makes a very effective tool for inorganic and organic surface analysis. The combination provides top atomic layer analysis, surface chemical mapping, static and dynamic depth profiling, 3D chemical imaging, layer thickness measurement, and quantification. Adding the Qtac to Other Instrumentation Many manufacturing, surface treatment, and thin layer deposition techniques benefit from on-line quality control. For coverage and layer thickness measurements, the Qtac makes an ideal addition. The Qtac is available as a bolt-on system, tailored to individual requirements, for laboratory instruments or industrial tools. ALD and MBE instrumentation are typical examples.  |
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 Qtac bolt-on module including energy analyser and noble gas ion source Qtac bolt-on module attached to the preparation chamber of a TOF.SIMS 5 |