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TOF-SIMS Products Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications. It provides detailed elemental and molecular information about the surface, thin layers, interfaces of the sample, and gives a full three-dimensional analysis. The use is widespread, including semiconductors, polymers, paint, coatings, glass, paper, metals, ceramics, biomaterials, pharmaceuticals and organic tissue. The TOF.SIMS 5 and the TOF.SIMS 300 are the latest generation of high-end TOF-SIMS instruments developed over the last 25 years. Their design guarantees optimum performance in all fields of SIMS applications. LEIS Products The significant advantages of low energy ion scattering (LEIS) are extreme surface sensitivity and quantification. Contrary to many other established surface analysis techniques such as XPS or AES, which generally integrate over several atomic layers, LEIS characterises individual atomic layers. These features make the Qtac100 an extremely valuable instrument when information about the composition of the first atomic layer is required. Static depth profiling is used to analyse the sub-surface atomic layers and to determine layer thicknesses. The Qtac100 extends the range of LEIS applications to surface imaging and dynamic sputter depth profiling. NanoScan SPM Products Magnetic Force Microscopy provides detailed information about magnetic structures on the nanometer scale. It also allows analysing the influence of low temperatures and strong external magnetic fields on magnetic properties. The technique can be applied in many different research areas such as data storage, biophysics, material science. In particular the hard-disk and MRAM industries, with their rapid development of increasing storage capacities, rely on Magnetic Force Microscopy for characterising the shape and quality of their products. |
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