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11.01.2010
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Number of TOF.SIMS 5 exceeds 100
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ION-TOF is proud to announce that the very successful TOF.SIMS 5 has now been sold more than a hundred times. In December 2009 ION-TOF received orders number 100 and 101. The hundredth instrument will be installed at the Ulsan National Institute of Science and Technology (UNIST) in South Korea.
TOF.SIMS 5
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09.10.2009
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NanoScan Product Distribution
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As previously announced, ION-TOF GmbH has recently acquired the majority of the shares of the Swiss company NanoScan Ltd.
NanoScan offers the high-resolution magnetic force microscope (hr-MFM) and the high-resolution atomic force microscope for the physical properties measurement system (PPMS®-AFM).
We are pleased to inform that ION-TOF GmbH will now channel all related marketing and sales efforts in Muenster. Together with the skilled scientists at NanoScan, the experienced ION-TOF sales team is looking forward to extending the market for these extraordinary devices.
If you would like to receive further information, please contact sales@iontof.com.
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30.09.2009
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First Qtac installation
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ION-TOF GmbH is pleased to announce the successful installation of its first Qtac instrument in the Department of Catalysis and Materials at the University of Lille in France. After a smooth and punctual acceptance, the system has now begun routine operation and will support the users in gaining valuable information about their samples, which include materials such as catalysts, metals and polymers.
The Qtac, which is able to measure the properties of the first monolayer of the sample, has been supplied in combination with a TOF.SIMS 5 and an Axis Ultra XPS from Kratos Analytical Ltd. The complementary analysis capabilities of these instruments provide the University of Lille with a very powerful surface analysis system.
We wish the University of Lille every success in their research endeavours using the new system!
LEIS, TOF-SIMS, XPS combination instrument at the University of Lille
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