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27.05.2009
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Fully refurbished ION-TOF instruments for sale
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We are pleased to announce that we have some used instruments for sale at the moment. There are older
TOF-SIMS IV type instruments available as well as instruments of the current type TOF.SIMS 5. The latter have previously been used as demonstration or R & D equipment.
Prices start from 200,000.00 EUR, depending on the configuration and on upgrades you may wish to purchase.
All instruments are in a very good condition and have undergone thorough functionality tests at ION-TOF GmbH.
If you would like additional information or if you are interested in obtaining a quotation for any of the above-mentioned instruments please contact sales@iontof.com.
TOF-SIMS IV
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06.04.2009
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ION-TOF acquires majority of NanoScan shares
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We are pleased to announce that ION-TOF GmbH has recently acquired the majority of the shares of the Swiss company NanoScan Ltd.
NanoScan Ltd. is a spin-off company of the University of Basel. The company was set up in 2003, when the initiators at the Institute of Physics developed a prototype of their high-resolution Magnetic Force Microscope capable of enhancing the resolution by a factor of ten compared to other available microscopes.
Today, NanoScan offers the high-resolution magnetic force microscope (hr-MFM) and the high-resolution atomic force microscope for the physical properties measurement system (PPMS®-AFM).
After the acquisition NanoScan will remain an independent company in Switzerland. Dr. Raphaëlle Dianoux has been appointed CEO and will lead the company together with Dr. Guido Tarrach as CTO. Both scientists have long-term experience in the development and the application of scanning probe microscopy.
This acquisition will grant ION-TOF access to new technologies in the field of nanoscience, thus strengthening our position as a leading manufacturer of instrumentation for surface analysis. We are certain that our future product lines will benefit from these new technologies.
NanoScan: High Resolution Magnetic Force Microscope (hr-MFM)
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04.11.2008
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SIMS IV China and ISSIMS 08 Beijing
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From 26th to 29th October 2008, the 4th Chinese Conference on Secondary Ion Mass Spectrometry (SIMS IV China) and the 2008 Beijing International Symposium on Secondary Ion Mass Spectrometry (ISSIMS 08 Beijing) took place in Beijing. ION-TOF attended these events in co-operation with their local agent, GermanTech, and gave the following talks:
Recent Developments in TOF-SIMS and Low Energy Ion Scattering (LEIS)
Characterisation of Microstructures and Nanostructures by Cluster SIMS
Thin Film Characterisation with TOF-SIMS and LEIS
It was exciting to see the impressive level of SIMS activity in China. The conferences proved to be a good opportunity for exchanging knowledge and new ideas.
The attendees of the event.
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05.11.2008
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55th AVS Meeting 2008
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The AVS 55th International Symposium and Exhibition was held recently in the USA in Boston, MA.
Attended by around 3,000 people the week's symposium was a lively affair with lots of good scientific discussions and plenty of occasions to socialize too.
Three talks were presented by ION-TOF personnel:
A Novel Bismuth-Manganese Emitter for G-SIMS Spectroscopy and Imaging (by Felix Kollmer)
Latest Developments and Applications of the Qtac 100 for High Sensitivity LEIS (by Thomas Grehl)
Applications of TOF-SIMS and LEIS for the Characterization of Ultra-Thin Films (by Thomas Grehl)
These talks were well attended and all received a very positive response from the audience.
It was great to see so many familiar faces as well as meet some new ones, that we hope to see again in the near future.
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29.09.2008
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Users Meeting 2008
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We held our fifth Users Meeting on 16th and 17th September, following SIMS Europe 2008. This was once again a perfect opportunity for exchanging information, news and ideas.
For the social evening, about 100 customers and staff visited the popular zoo of Muenster, which is well-known from television and surely one of the flagships among the town's places of interest.
During informative guided tours, we got a good look around the zoo which was already closed for the public at that time. Afterwards, we took our guests "under the sea" by inviting them to a delicious candlelight dinner buffet held at the aquarium.
On the following day, we assembled at the Technology Centre just opposite the ION-TOF building. News of the company were presented and two users gave highly interesting presentations on their TOF-SIMS applications. Of course, their efforts were rewarded with a souvenir of Muenster.
Many attendees also took the chance to see our new product, the Qtac, which received a lot of interest during the Users Meeting and was one of the main topics addressed on that day.
It was a pleasure for us to meet so many of our customers here in Muenster and we are looking forward to seeing everyone again next time!
Photo: Allwetterzoo Münster
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23.09.2008
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First Qtac for the Department of Catalysis and Materials at the University of Lille
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In October 2007, during the AVS in Seattle, ION-TOF officially launched its new Low Energy Ion Scattering (LEIS) instrument, the Qtac100. There has been great interest from many sectors, both academic and industrial, and many potential customers visited our laboratory to work with the new tool.
Today, 10 months after the official launch, we are delighted to inform you that the first Qtac instrument was ordered by the Department of Catalysis and Materials at the University of Lille in Northern France. The UHV combination with a TOF.SIMS 5 and a Kratos Axis Ultra XPS will make the instrument a very powerful surface analytical tool. The Department of Catalysis and Materials at Lille is one of the biggest in France and the different techniques will be used to investigate a wide variety of materials. However, the Qtac will be particularly beneficial for their catalysis work, for which the analysis of the top atomic layer is essential. It is possible to keep the sample under UHV while applying different analytical techniques. Therefore, surface contamination between analyses is virtually eliminated. This is particularly important for LEIS analysis.
We will of course follow up and support the user’s activities very closely and we look forward to many interesting publications based on the use of the Qtac100.
View into the Qtac analysis chamber
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